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Hybrid Test Data Compression Technique for Low-power Scan Test Data

Title
Hybrid Test Data Compression Technique for Low-power Scan Test Data
Author
박성주
Issue Date
2007-11
Publisher
IEEE
Citation
2007 International Symposium on Information Technology Convergence (ISITC 2007), Page. 152-156
Abstract
The large test data volume and power consumption are major problems in testing System-on-a-Chip (SoC) which is a key component of todays embedded system. To reduce the test application time from an Automatic Test Equipment (ATE), a new test data compression technique is proposed in this paper. Don t-cares in a pre-computed test cube set are assigned to reduce the test power consumption. Then, fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or technique. Finally, test set converted is compressed to reduce test application time.
URI
https://ieeexplore.ieee.org/document/4410624http://repository.hanyang.ac.kr/handle/20.500.11754/107255
ISBN
0-7695-3045-1
DOI
10.1109/ISITC.2007.11
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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