Data retention characteristics of Bi3.25La0.75Ti3O12 thin films on conductive SrRuO3 electrodes
- Title
- Data retention characteristics of Bi3.25La0.75Ti3O12 thin films on conductive SrRuO3 electrodes
- Author
- 강보수
- Keywords
- HYDROGEN-INDUCED DEGRADATION; POLARIZATION RETENTION; CAPACITORS; NANOSCALE; MEMORIES; TITANATE; CRYSTAL; IRO2
- Issue Date
- 2007-10
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v. 91, No. 14, Article no. 142901
- Abstract
- Ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films were deposited on SrRuO3 (SRO) and Pt electrodes by pulsed laser deposition. The data retention characteristics of the BLT films on different electrode materials were characterized. The experimental results are well fitted by a stretched exponential decay model, indicating that BLT films on both Pt and SRO exhibit the similar decay mechanisms. However, the decay behavior is quite different due to the use of different bottom electrodes. The superior data retention performance of BLT film on conductive SRO electrode is believed to be from the reduction of domain polarization backswitching originated from the oxygen vacancies in the depletion region of BLT films. (c) 2007 American Institute of Physics.
- URI
- https://aip.scitation.org/doi/abs/10.1063/1.2780118https://repository.hanyang.ac.kr/handle/20.500.11754/107197
- ISSN
- 0003-6951; 1077-3118
- DOI
- 10.1063/1.2780118
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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