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Electrode Dependence of Resistance Switching in NiO Thin Films

Title
Electrode Dependence of Resistance Switching in NiO Thin Films
Author
김동욱
Keywords
resistance switching; NiO; current-voltage measurement
Issue Date
2007-10
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 51, Page. S88-S91
Abstract
We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, An and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-voltage (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures axe nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.
URI
http://www.jkps.or.kr/journal/view.html?uid=9045&vmd=Fullhttp://repository.hanyang.ac.kr/handle/20.500.11754/106983
ISSN
0374-4884; 1976-8524
DOI
10.3938/jkps.51.88
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > ETC
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