Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성주 | - |
dc.date.accessioned | 2019-05-22T02:58:06Z | - |
dc.date.available | 2019-05-22T02:58:06Z | - |
dc.date.issued | 2018-04 | - |
dc.identifier.citation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 18, No. 2, Page. 218-226 | en_US |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.uri | http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE07420101 | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/105478 | - |
dc.description.abstract | Scan flip-flop based physically unclonable function (SCAN-PUF) has been proposed to protect integrated circuits (ICs) from security threats such as unauthorized access and IC cloning. In this paper, we propose an efficient SCAN-PUF technique that improves the uniqueness of responses with low cost overhead. The proposed SCAN-PUF first determines an optimal number of power-up state observations and then selects scan flip-flops as the PUF elements (P-ELEMENTs) through a given number of observations. A Bayesian model is adopted to evaluate the reliability of the P-ELEMENTs, and a grouped P-ELEMENT selection method is introduced to obtain more P-ELEMENTs than a predetermined threshold. To evaluate the proposed SCAN-PUF, we observed the power-up states of scan flip-flops from 15 chips fabricated using the 65-nm CMOS technology. The optimal number of observations is determined according to the reliability of the P-ELEMENTs, and the reliability, randomness, and uniqueness of the responses are then analyzed. | en_US |
dc.description.sponsorship | This research was partly supported by the MOTIE (Ministry of Trade, Industry & Energy (10052875)) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device and the National Research Foundation of Korea Grant funded by the Ministry of Education, Science and Technology under Grant NRF-2017R1D1A1B03030821. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | 대한전자공학회 | en_US |
dc.subject | Bayesian theorem | en_US |
dc.subject | counterfeit ICs | en_US |
dc.subject | hardware security | en_US |
dc.subject | physically unclonable function | en_US |
dc.subject | scan design | en_US |
dc.title | Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.5573/JSTS.2018.18.2.218 | - |
dc.relation.page | 218-226 | - |
dc.relation.journal | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.contributor.googleauthor | Kim, Dooyoung | - |
dc.contributor.googleauthor | Ansari, M. Adil | - |
dc.contributor.googleauthor | Jung, Jihun | - |
dc.contributor.googleauthor | Kim, Jinuk | - |
dc.contributor.googleauthor | Park, Sungju | - |
dc.relation.code | 2018010757 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF COMPUTING[E] | - |
dc.sector.department | DIVISION OF COMPUTER SCIENCE | - |
dc.identifier.pid | paksj | - |
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