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dc.contributor.author김희준-
dc.date.accessioned2019-05-17T02:29:18Z-
dc.date.available2019-05-17T02:29:18Z-
dc.date.issued2008-05-
dc.identifier.citation전자공학회논문지 - SD, v. 45, No. 5, Page. 82-87en_US
dc.identifier.issn1229-6368-
dc.identifier.urihttp://www.dbpia.co.kr/Journal/ArticleDetail/NODE00997269-
dc.identifier.urihttp://repository.hanyang.ac.kr/handle/20.500.11754/104553-
dc.description.abstract본 논문은 고속 위상 고정이 가능한 새로운 듀얼 슬로프 위상고정루프를 제안한다. 기존의 듀얼 슬로프 위상고정루프는 각각 2개의 전하펌프와 위상 주파수 검출기로 구성되었다. 본 논문에서는 위상차에 따라 전하펌프의 전류를 조절해 하나의 전하펌프와 위상 주파수 검출기만으로 듀얼 슬로프 위상고정루프를 구현하였다. 제안된 회로는 0.35㎛ CMOS 공정 파라미터 값으로 HSPICE 시뮬레이션을 수행하여 회로의 동작을 검증하였다. 제안된 듀얼 슬로프 위상고정루프의 위상 고정 시간은 2.2㎲로 단일 슬로프 위상고정루프의 위상 고정 시간인 7㎲보다 개선된 결과를 얻었다. This paper presents a new fast locking dual-slope phase-locked loop. The conventional dual-slope phase-locked loop consists of two charge pumps and two phase-frequency detectors. In this paper, the dual-slope phase-locked loop was achieved with a charge pump and a phase-frequency detector as adjusting a current of the charge pump according to the phase difference. The proposed circuit was verified by HSPICE simulation with a 0.35㎛ CMOS standard process parameter. The phase locking time of the proposed dual-slope phase-locked loop was 2.2㎲ and that of the single-slope phase-locke loop was 7㎲.en_US
dc.language.isoko_KRen_US
dc.publisher대한전자공학회en_US
dc.subjectDual-slopeen_US
dc.subjectFast lockingen_US
dc.subjectPhase-Locked Loop (PLL)en_US
dc.title위상고정시간이 빠른 새로운 듀얼 슬로프 위상고정루프en_US
dc.title.alternativeA Fast Locking Phase-Locked Loop using a New Dual-Slope Phase Frequency Detector and Charge Pump Architectureen_US
dc.typeArticleen_US
dc.relation.journal전자공학회논문지-
dc.contributor.googleauthor박종하-
dc.contributor.googleauthor김훈-
dc.contributor.googleauthor김희준-
dc.relation.code2012210989-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidhjkim-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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