Application of ellipsometry in immersion lithography

Title
Application of ellipsometry in immersion lithography
Author
오혜근
Issue Date
2008-05
Publisher
WILEY-VCH VERLAG GMBH & CO. KGAA, WEINHEIM
Citation
Physica Status Solidi (C) Current Topics in Solid State Physics, v. 5, No. 5, Page. 1414-1418
Abstract
Optical lithography with an ArF excimer laser (193 nm) can produce sub 100nm patterns. Without the reduction of wavelength, further increase in resolution is expected by employing an immersion technique in which a liquid medium is filled between the objective lens and underlying photoresist. In this case, resolution can be enhanced through the increase of numerical aperture. However, in order for immersion lithography to be successful, many problems associated with the liquid environment need to be solved. One of the serious problems is the interaction between liquid and photoresist. Liquid may penetrate into the photoresist and cause leaching problem. This in turn modifies the physical and chemical properties of the photoresist. Thus, it is important to monitor the modification of the photoresist by immersion liquid. In this work, spectroscopic ellipsometry and imaging ellipsometry are used to investigate the absorption of liquid by photoresist as well as top coat which is used to prevent water penetration into underlying photoresist. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
URI
https://onlinelibrary.wiley.com/doi/abs/10.1002/pssc.200777867http://repository.hanyang.ac.kr/handle/20.500.11754/104515
ISSN
1862-6351
DOI
10.1002/pssc.200777867
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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