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Test Access Mechanism for Automotive Chips through Vehicular Control Networks

Title
Test Access Mechanism for Automotive Chips through Vehicular Control Networks
Author
박성주
Keywords
ECUs; Diagnosis; Test Access Mechanism; CAN; FlexRay
Issue Date
2016-10
Publisher
IEEE
Citation
2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia), Page. 1-2
Abstract
Modern automobiles house many ECUs (Electronic Control Units), which are connected through VCNs (Vehicle Control Networks). Typically, integrated circuits are tested for structural defects, which could occur during fabrication. In general, vehicular ECUs are tested for functional operation. However, due to vibrations, high temperature, etc., defects might be developed in ICs. This work presents a test access mechanism for in-vehicle ICs based on VCNs. The proposed test access mechanism complies with protocols of VCNs and allows the access to the on-chip circuitry.
URI
https://ieeexplore.ieee.org/document/7804728/http://repository.hanyang.ac.kr/handle/20.500.11754/102843
ISBN
978-1-5090-2743-9
DOI
10.1109/ICCE-Asia.2016.7804728
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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