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FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법

Title
FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법
Other Titles
A Vehicle SoC Fault Diagnosis Technique using FlexRay Protocol
Author
박성주
Keywords
FlexRay Protocol; Null Frame Indicator; IEEE 1149.1; FPGA; BIST; Structural test
Issue Date
2016-01
Publisher
한국컴퓨터정보학회
Citation
한국컴퓨터정보학회논문지, v. 21, No. 1, Page. 39-47
Abstract
In this paper, we propose vehicle SoC fault diagnosis platform using FlexRay protocol in order to detect the faults of semiconductor control chip even after vehicle production. Before FlexRay protocol by sending NFI (Null Frame Indicator) bit among the header segment and a specific identifier in the payload segment of FlexRay frame, this technique can be distinguishable from normal mode and test mode. By using this technique, it is possible to detect the faults such as performance degradation of vehicle network system caused by the aging or several problems of vehicle semiconductor chip. Also high reliability and safety of vehicle can be maintained by using structural test for vehicle SoC fault detection.
URI
http://www.dbpia.co.kr/Journal/ArticleDetail/NODE06597817http://repository.hanyang.ac.kr/handle/20.500.11754/102079
ISSN
1598-849X
Appears in Collections:
ETC[S] > 연구정보
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