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SCAN-PUF: PUF Elements Selection Methods for Viable IC Identification

Title
SCAN-PUF: PUF Elements Selection Methods for Viable IC Identification
Author
박성주
Keywords
physically unclonable function; hardware security; IC identificaion; scan PUF
Issue Date
2015-11
Publisher
IEEE
Citation
2015 IEEE 24th Asian Test Symposium (ATS), Page. 121-126
Abstract
The scan PUF, which is based-on the power-up states of scan flip-flops, had been proposed to overcome security issues of semiconductor ICs. IC identification, one of those security issues, requires decent uniqueness along with reliability and randomness. This paper presents two efficient PUF elements' selection methods for scan PUF: uniqueunanimous selection method and unique-majority selection method. These methods classify the scan cells according to their trend of power-up states and prioritize them to extract PUF elements. For experiments, enrollment and validation is performed on 15 chips, which are fabricated with 65nm CMOS process. A statistical analysis on experiments verifies the performance of proposed selection methods.
URI
http://ieeexplore.ieee.org/document/7422246/http://repository.hanyang.ac.kr/handle/20.500.11754/101889
ISBN
978-1-4673-9739-1
ISSN
2377-5386
DOI
10.1109/ATS.2015.28
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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