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dc.contributor.author김수은-
dc.date.accessioned2019-03-19T00:25:41Z-
dc.date.available2019-03-19T00:25:41Z-
dc.date.issued2015-07-
dc.identifier.citationNATURE MATERIALS, v. 14, No. 7, Page. 714-720en_US
dc.identifier.issn1476-1122-
dc.identifier.issn1476-4660-
dc.identifier.urihttps://www.nature.com/articles/nmat4322-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/100960-
dc.description.abstractTwo-dimensional materials, such as graphene and MoS2, are films of a few atomic layers in thickness with strong in-plane bonds and weak interactions between the layers. The in-plane elasticity has been widely studied in bending experiments where a suspended film is deformed substantially; however, little is known about the films' elastic modulus perpendicular to the planes, as the measurement of the out-of-plane elasticity of supported 2D films requires indentation depths smaller than the films' interlayer distance. Here, we report on sub-angstrom-resolution indentation measurements of the perpendicular-to-the-plane elasticity of 2D materials. Our indentation data, combined with semi-analytical models and density functional theory, are then used to study the perpendicular elasticity of few-layer-thick graphene and graphene oxide films. We find that the perpendicular Young's modulus of graphene oxide films reaches a maximum when one complete water layer is intercalated between the graphitic planes. This non-destructive methodology can map interlayer coupling and intercalation in 2D films.en_US
dc.description.sponsorshipY.G., S.K., H-C.C. and E.R., acknowledge the support of the Office of Basic Energy Sciences of the US Department of Energy (DE-FG02-06ER46293). S.Z. and A.B. acknowledge the support of the National Science Foundation (NSF) grant CMMI 1436375. S.Z., A.B., C.B. and W.d.H. acknowledge the support of the NSF grant DMR-0820382. C.B. acknowledges partial financial support from the European Flagship Graphene. A.B. acknowledges the support of the NSF grant CHE-0946869. R.S. acknowledges the support of the Italian Cariplo Foundation, project No. 2011-0373. We thank J-P. Turmaud for the EG on Si sample.en_US
dc.language.isoen_USen_US
dc.publisherNATURE PUBLISHING GROUPen_US
dc.subjectGRAPHENE OXIDEen_US
dc.subjectEPITAXIAL GRAPHENEen_US
dc.subjectMULTILAYER GRAPHENEen_US
dc.subjectFORCE MICROSCOPYen_US
dc.subjectCONTACT AREAen_US
dc.subjectHALF-SPACEen_US
dc.subjectFRICTIONen_US
dc.subjectFILMSen_US
dc.subjectSHEARen_US
dc.subjectTRANSPARENTen_US
dc.titleElastic coupling between layers in two-dimensional materialsen_US
dc.typeArticleen_US
dc.relation.no7-
dc.relation.volume14-
dc.identifier.doi10.1038/nmat4322-
dc.relation.page714-714-
dc.relation.journalNATURE MATERIALS-
dc.contributor.googleauthorGao, Yang-
dc.contributor.googleauthorKim, Suenne-
dc.contributor.googleauthorZhou, Si-
dc.contributor.googleauthorChiu, Hsiang-Chih-
dc.contributor.googleauthorNélias, Daniel-
dc.contributor.googleauthorBerger, Claire-
dc.contributor.googleauthorde Heer, Walt-
dc.contributor.googleauthorPolloni, Laura-
dc.contributor.googleauthorSordan, Roman-
dc.contributor.googleauthorBongiorno, Angelo-
dc.contributor.googleauthorRiedo, Elisa-
dc.relation.code2015003361-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF PHOTONICS AND NANOELECTRONICS-
dc.identifier.pidskim446-
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