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dc.contributor.author박성주-
dc.date.accessioned2019-03-08T05:56:40Z-
dc.date.available2019-03-08T05:56:40Z-
dc.date.issued2015-05-
dc.identifier.citation2015 20th IEEE European Test Symposium (ETS), Article no. 7138767en_US
dc.identifier.isbn978-1-4799-7603-4-
dc.identifier.issn1530-1877-
dc.identifier.issn1558-1780-
dc.identifier.urihttp://ieeexplore.ieee.org/document/7138767-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/100649-
dc.description.abstractThe semiconductor aging is one of the serious threats for the reliability of the system. This paper presents an efficient mechanism for predicting the aging effect. The captured data will be unloaded by shift operation, then verified through the aging monitoring operation. Especially the aging level of automotive semiconductor devices can be estimated by controlling the capture timing. Since the aging monitoring function is efficiently on and off during normal operation, power consumption can be reduced significantly compared with other approaches.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.subjectaging monitoringen_US
dc.subjectscan flip-flopen_US
dc.subjecton-line testen_US
dc.titleEfficient Diagnosis Technique for Aging Defects on Automotive Semiconductor Chipsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ETS.2015.7138767-
dc.relation.page1-2-
dc.contributor.googleauthorJung, Jihun-
dc.contributor.googleauthorAnsari, Muhammad Adil-
dc.contributor.googleauthorKim, Dooyoung-
dc.contributor.googleauthorYi, Hyunbean-
dc.contributor.googleauthorPark, Sungju-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF COMPUTING[E]-
dc.sector.departmentDIVISION OF COMPUTER SCIENCE-
dc.identifier.pidpaksj-
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