TY - JOUR AU - 박성주 DA - 2007/11 PY - 2007 SN - 0-7695-3045-1 UR - https://ieeexplore.ieee.org/document/4410624 UR - https://repository.hanyang.ac.kr/handle/20.500.11754/107255 AB - The large test data volume and power consumption are major problems in testing System-on-a-Chip (SoC) which is a key component of todays embedded system. To reduce the test application time from an Automatic Test Equipment (ATE), a new test data compression technique is proposed in this paper. Don t-cares in a pre-computed test cube set are assigned to reduce the test power consumption. Then, fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or technique. Finally, test set converted is compressed to reduce test application time. PB - IEEE TI - Hybrid Test Data Compression Technique for Low-power Scan Test Data DO - 10.1109/ISITC.2007.11 ER -