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Showing results 13 to 42 of 79

Issue DateTitleAuthor(s)
2016-01Degradation Characteristics of MgO Based Magnetic Tunnel Junction Caused by Surface Roughness of Ta/Ru Buffer Layers송윤흡
2017-10Design and Fabrication of Capacitive Silicon Nanomechanical Resonators with Selective Vibration of a High-Order Mode송윤흡
2019-10Design of FPGA-Based LZ77 Compressor With Runtime Configurable Compression Ratio and Throughput송윤흡
2017-10A Dummy Cell Added Neural Network Using in Pattern Recognition for Prevention of Failed Events송윤흡
2014-04Effect of an Interface Mg Insertion Layer on the Reliability of a Magnetic Tunnel Junction based on a Co2FeAl Full-Heusler Alloy송윤흡
2018-08The Effect of Mechanical Stress on Cell Characteristics in MONOS Structures송윤흡
2016-03Effect of Mg insertion on stress-induced resistance drift in MgO-based magnetic tunnel junctions송윤흡
2016-06Effect of Mg insertion on time-dependent dielectric breakdown in MgO-based magnetic tunnel junctions송윤흡
2014-01Effect of the trap level of the silicon nitride layer on the retention characteristics of GAA-MONOS charge trap memories at elevated temperature송윤흡
2019-02The Effect of Tungsten Volume on Residual Stress and Cell Characteristics in MONOS송윤흡
2017-08Endurance of magnetic tunnel junctions under dynamic voltage stress송윤흡
2017-05Fabrication and evaluation of capacitive silicon resonators with piezoresistive heat engines송윤흡
2016-04Fabrication of Vacuum-Sealed Capacitive Micromachined Ultrasonic Transducer Arrays Using Glass Reflow Process송윤흡
2017-07GaSb/InGaAs 2-dimensional hole gas grown on InP substrate for III-V CMOS applications송윤흡
2020-11High Hole Mobility and Low Leakage Thin-Body (In)GaSb p-MOSFETs Grown on High-Bandgap AlGaSb송윤흡
2018-08High hole mobility in strained In0.25Ga0.75Sb quantum well with high quality Al0.95Ga0.05Sb buffer layer송윤흡
2020-11High-Performance Thin-Film Transistors with an Atomic-Layer-Deposited Indium Gallium Oxide Channel: A Cation Combinatorial Approach송윤흡
2016-10Impact of contact resistance on memory window in phase-change random access memory (PCRAM)송윤흡
2018-09Impact of etch angles on cell characteristics in 3D NAND flash memory송윤흡
2017-12Impact of Grain Length and Grain Boundary on Dispersion of Threshold Voltage for 3-Dimensional Gate-All-Around Polysilicon Channel Memory송윤흡
2018-01Inverse Resistance Change Cr2Ge2Te6-Based PCRAM Enabling Ultralow-Energy Amorphization송윤흡
2013-05Investigation of a selective switching device using a phase-change material for a 3-dimensional PCRAM array송윤흡
2013-05Investigation of a selective switching device using a phase-change material for a 3-dimensional PCRAM array송윤흡
2016-08Investigation of an erasing method for synaptic behaviour in a phase change device using Ge1Cu2Te3 (GCT)송윤흡
2018-03Investigation of bias polarity dependence of set operation in GeCu2Te3 phase change memory송윤흡
2015-03Investigation of in-situ doping profile for N plus /P/N plus bidirectional switching device using Si1-xGex/Si/Si1-xGex structure송윤흡
2014-11Investigation of In-situ Doping Profile for N+/P/N+ Bidirectional Switching Device using Si1-xGex/Si/Si1-xGex Structure송윤흡
2018-01Investigation of ramped voltage stress to screen defective magnetic tunnel junctions송윤흡
2017-05Investigation of the Effect of Grain for Vertically Stacked NAND Flash Memory with a Poly-GaAs Channel송윤흡
2019-04Investigation of the Impact of External Stress on Memory Characteristics by Modifying the Backside of Substrate송윤흡

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