Browsing by Author 박성주

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Showing results 9 to 38 of 53

Issue DateTitleAuthor(s)
2007-05Design of Test Access Mechanism for AMBA Based System-on-a-Chip박성주
2007-10Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC박성주
2008-11A Design-for-Debug(DfD) for NoC-Based SoC Debugging via NoC박성주
2015-05Efficient Diagnosis Technique for Aging Defects on Automotive Semiconductor Chips박성주
2005-05Efficient Interconnect Test Patterns and BIST Implementation for Crosstalk and Static Faults박성주
2008-06An Efficient Interconnect Test Patterns for Crosstalk and Static Faults박성주
2006-11Efficient Interconnect Test Patterns for Crosstalk and Static Faults박성주
2007-12An Efficient Link Controller for Test Access to IP Core-based Embedded System Chips박성주
2016-04Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells박성주
2008-10An Efficient Secure Scan Design for an SoC Embedding AES Core박성주
2016-01FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법박성주
2007-11Hybrid Test Data Compression Technique for Low-power Scan Test Data박성주
2005-09Hybrid Test Data Compression Technique for SoC Scan Testing박성주
2006-10IEEE 1149.1 테스트 기능이 내장된 PCI/USB 통합 인터페이스 회로의 설계박성주
2008-02IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트박성주
2008-06Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains박성주
2006-10Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains박성주
2008-05Low Cost Scan Test for IEEE 1500-Based SoC박성주
2016-10Low Power Scan Chain Reordering Method with Limited Routing Congestion for Code-based Test Data Compression박성주
2014-02Multiple Series Diode Biosensors with PtSi/p/p++-Si lateral junctions박성주
2017-07On Diagnosing the Aging Level of Automotive Semiconductor Devices박성주
2008-06Optimal SoC Test Interface for Wafer and Final Tests박성주
2006-10Parallel CRC Logic Optimization Algorithm for High Speed Communication Systems박성주
2015-11SCAN-PUF: PUF Elements Selection Methods for Viable IC Identification박성주
2016-10Test Access Mechanism for Automotive Chips through Vehicular Control Networks박성주
2019-02Time Division Multiplexing based Test Access for Stacked ICs박성주
2018-08Time-Multiplexed 1687-Network for Test Cost Reduction박성주
2016-07Time-multiplexed test access architecture for stacked integrated circuits박성주
2017-02간헐적 재난의 효과적인 관리를 위한 협력적 네트워크의 역할박성주
2005-07논리 최적화 기법을 이용한 병렬 회로 설계 CRC박성주