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Showing results 31 to 60 of 144

Issue DateTitleAuthor(s)
2015-05Efficient diagnosis technique for aging defects on automotive semiconductor chips박성주
2005-05Efficient Interconnect Test Patterns and BIST Implementation for Crosstalk and Static Faults박성주
2006-11Efficient Interconnect Test Patterns for Crosstalk and Static Faults박성주
2008-06An Efficient Interconnect Test Patterns for Crosstalk and Static Faults박성주
2007-12An Efficient Link Controller for Test Access to IP Core-based Embedded System Chips박성주
2020-08Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering박성주
2020-08Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering박성주
2014-06Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC박성주
2016-04Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells박성주
2008-10An Efficient Secure Scan Design for an SoC Embedding AES Core박성주
2012-09Efficient Use of Unused Spare Columns for Reducing Memory Miscorrections박성주
2011-11Efficient use of unused spare columns to improve memory error correcting rate박성주
2017-11Enabling test/diagnosis of automotive semiconductor chips through FlexRay network박성주
2016-01FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법박성주
2016-01FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법박성주
2013-11FlexRay를 이용한 자동차 신뢰성 향상 기법박성주
2009-06Flit-Partitioned Parallel Test Technique for NoC Based SoCs박성주
2014-05Frequency-ordered 기반 FDR 테스트패턴 압축 알고리즘박성주
2002-12A Genetic Algorithm for the Minimization of OPKFDDs박성주
2009-01Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults박성주
2021-09Highly Efficient Test Architecture for Low Power AI Accelerators박성주
2007-11Hybrid Test Data Compression Technique for Low-power Scan Test Data박성주
2005-09Hybrid Test Data Compression Technique for SoC Scan Testing박성주
2015-02Hybrid Test Data Transportation Scheme for Advanced NoC-Based SoCs박성주
2006-10IEEE 1149.1 테스트 기능이 내장된 PCI/USB 통합 인터페이스 회로의 설계박성주
2006-10IEEE 1149.1 테스트 기능이 내장된PCI/USB 통합 인터페이스 회로의 설계박성주
2013-09IEEE 1149.7 표준 테스트 인터페이스를 사용한 핀 수 절감 테스트 기술박성주
2008-02IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트박성주
2020-02An Improved LDPC ECC based on System Level Reprogramming for MLC NAND Flash박성주
2004-11InfiniBand/PCI-Express 4X Framer/Deframer 모듈 FPGA설계박성주

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